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DAC
2010
ACM
15 years 11 months ago
LUT-based FPGA technology mapping for reliability
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
Jason Cong, Kirill Minkovich
ANCS
2006
ACM
15 years 11 months ago
Efficient memory utilization on network processors for deep packet inspection
Deep Packet Inspection (DPI) refers to examining both packet header and payload to look for predefined patterns, which is essential for network security, intrusion detection and c...
Piti Piyachon, Yan Luo
COLT
2004
Springer
15 years 11 months ago
A New PAC Bound for Intersection-Closed Concept Classes
For hyper-rectangles in Rd Auer et al. [1] proved a PAC bound of O 1 (d + log 1 ) , where and are the accuracy and confidence parameters. It is still an open question whether one...
Peter Auer, Ronald Ortner
DAC
2004
ACM
15 years 11 months ago
A methodology to improve timing yield in the presence of process variations
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
Sreeja Raj, Sarma B. K. Vrudhula, Janet Meiling Wa...
DATE
2004
IEEE
144views Hardware» more  DATE 2004»
15 years 11 months ago
A Framework for Battery-Aware Sensor Management
A distributed sensor network (DSN) designed to cover a given region R, is said to be alive if there is at least one subset of sensors that can collectively cover (sense) the regio...
Sridhar Dasika, Sarma B. K. Vrudhula, Kaviraj Chop...
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