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WSC
1998
15 years 9 months ago
Validation and Verification of the Simulation Model of a Photolithography Process in Semiconductor Manufacturing
Simulation modeling provides an effective and powerful approach for capturing and analyzing complex manufacturing systems. More and more decisions are based on computer generated ...
Nirupama Nayani, Mansooreh Mollaghasemi
CORR
2008
Springer
84views Education» more  CORR 2008»
15 years 7 months ago
Nested Ordered Sets and their Use for Data Modelling
In this paper we present a new approach to data modelling, called the concept-oriented model (CoM), and describe its main features and characteristics including data semantics and ...
Alexandr A. Savinov
CVPR
2004
IEEE
16 years 9 months ago
Tomographic Reconstruction of Piecewise Smooth Images
In computed tomography, direct inversion of the Radon transform requires more projections than are practical due to constraints in scan time and image accessibility. Therefore, it...
Christopher V. Alvino, Anthony J. Yezzi Jr.
195
Voted
ICML
2004
IEEE
16 years 8 months ago
Automated hierarchical mixtures of probabilistic principal component analyzers
Many clustering algorithms fail when dealing with high dimensional data. Principal component analysis (PCA) is a popular dimensionality reduction algorithm. However, it assumes a ...
Ting Su, Jennifer G. Dy
ISSRE
2000
IEEE
16 years 2 days ago
Module Size Distribution and Defect Density
Data from several projects show a significant relationship between the size of a module and its defect density. Here we address implications of this observation. Does the overall ...
Yashwant K. Malaiya, Jason Denton