7167 search results - page 152 / 1434 » A Technique for Invariant Generation |
160
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ICCAD
2004
IEEE
16 years 4 months ago
2004
IEEE
We address the classic wire-length estimation problem and propose a new statistical wire-length estimation approach that captures the probability distribution function of net leng...
173
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IV
2009
IEEE
16 years 1 months ago
2009
IEEE
We have various interesting time series data in our daily life, such as weather data (e.g., temperature and air pressure) and stock prices. Polyline chart is one of the most commo...
150
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ISCAS
2008
IEEE
16 years 1 months ago
2008
IEEE
— A precision integrated bandgap voltage reference in 0.35μm CMOS technology is here presented. The circuit uses natural npn bipolar transistors as reference diodes. A particula...
197
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ICSM
2005
IEEE
16 years 20 days ago
2005
IEEE
Regression testing is an important part of software maintenance, but it can also be very expensive. To reduce this expense, software testers may prioritize their test cases so tha...
152
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DATE
2003
IEEE
16 years 11 days ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...