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» A Technique for Invariant Generation
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DATE
2008
IEEE
109views Hardware» more  DATE 2008»
16 years 1 months ago
Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad...
ISSRE
2006
IEEE
16 years 1 months ago
BPEL4WS Unit Testing: Test Case Generation Using a Concurrent Path Analysis Approach
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
Jun Yan, Zhong Jie Li, Yuan Yuan, Wei Sun, Jian Zh...
MM
2006
ACM
175views Multimedia» more  MM 2006»
16 years 1 months ago
Real-time automatic 3D scene generation from natural language voice and text descriptions
Automatic scene generation using voice and text offers a unique multimedia approach to classic storytelling and human computer interaction with 3D graphics. In this paper, we pre...
Lee M. Seversky, Lijun Yin
DATE
2005
IEEE
109views Hardware» more  DATE 2005»
16 years 25 days ago
ISEGEN: Generation of High-Quality Instruction Set Extensions by Iterative Improvement
Customization of processor architectures through Instruction Set Extensions (ISEs) is an effective way to meet the growing performance demands of embedded applications. A high-qua...
Partha Biswas, Sudarshan Banerjee, Nikil D. Dutt, ...
ISMIS
2005
Springer
16 years 21 days ago
Statistical Database Modeling for Privacy Preserving Database Generation
Abstract. Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively fe...
Xintao Wu, Yongge Wang, Yuliang Zheng