7167 search results - page 245 / 1434 » A Technique for Invariant Generation |
208
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DAC
2003
ACM
16 years 16 days ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
204
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
189
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DATE
1997
IEEE
15 years 11 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
189
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DFT
1997
IEEE
15 years 11 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
172
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SACRYPT
1998
Springer
15 years 11 months ago
1998
Springer
In this paper, we present a simple method for generating random-based signatures when random number generators are either unavailable or of suspected quality (malicious or accident...