7167 search results - page 260 / 1434 » A Technique for Invariant Generation |
187
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ICTAI
2002
IEEE
16 years 7 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
211
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VTS
2002
IEEE
16 years 6 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
168
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ICCV
2001
IEEE
16 years 9 months ago
2001
IEEE
In this paper, we present an example-based facial sketch system. Our system automatically generates a sketch from an input image, by learning from example sketches drawn with a pa...
200
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ICPR
2008
IEEE
16 years 8 months ago
2008
IEEE
We propose a new approach to estimate gait kinematics from image sequences taken by a monocular uncalibrated camera. This approach involves two generative models for gait represen...
185
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
In this paper, we explore the concept of using analytical models to efficiently generate delay change curves (DCCs) that can then be used to characterize the impact of noise on an...