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» A Technique for Invariant Generation
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DATE
2007
IEEE
138views Hardware» more  DATE 2007»
16 years 1 months ago
An ADC-BiST scheme using sequential code analysis
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
Erdem Serkan Erdogan, Sule Ozev
ECOOP
1999
Springer
15 years 11 months ago
Synthesizing Objects
This paper argues that the current OO technology does not support reuse and configurability in an effective way. This problem can be addressed by augmenting OO analysis and design ...
Krzysztof Czarnecki, Ulrich W. Eisenecker
IMR
1999
Springer
15 years 11 months ago
Parallel Advancing Front Grid Generation
The primary focus of this project is to design and implement a parallel framework for an unstructured mesh generator based on the advancing front method (AFM). In particular, we t...
Rainald Löhner, Juan R. Cebral
EDBT
2009
ACM
138views Database» more  EDBT 2009»
16 years 2 months ago
FOGGER: an algorithm for graph generator discovery
To our best knowledge, all existing graph pattern mining algorithms can only mine either closed, maximal or the complete set of frequent subgraphs instead of graph generators whic...
Zhiping Zeng, Jianyong Wang, Jun Zhang, Lizhu Zhou
DAC
2005
ACM
16 years 8 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin