21183 search results - page 131 / 4237 » Adaptive Testing by Test |
158
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
169
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
177
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...
168
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ISSRE
2008
IEEE
16 years 1 months ago
2008
IEEE
As software systems evolve, the size of their test suites grow due to added functionality and customer-detected defects. Many of these tests may contain redundant elements with pr...
148
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QSIC
2007
IEEE
16 years 1 months ago
2007
IEEE
: Testing against natural language requirements is the standard approach for system and acceptance testing. This test is often performed by an independent test organization unfamil...