6381 search results - page 250 / 1277 » Alternative Implementation of the C |
217
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ATS
2005
IEEE
16 years 27 days ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
188
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VLSI
2005
Springer
16 years 23 days ago
2005
Springer
Leakage power consumption of current CMOS technology is already a great challenge. ITRS projects that leakage power consumption may come to dominate total chip power consumption a...
186
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IQIS
2004
ACM
16 years 21 days ago
2004
ACM
A virtual database system is software that provides unified access to multiple information sources. If the sources are overlapping in their contents and independently maintained,...
163
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ICS
2003
Tsinghua U.
16 years 15 days ago
2003
Tsinghua U.
This paper performs a comprehensive investigation of dynamic selection for long atomic traces. It introduces a classification of trace selection methods and discusses existing and...
204
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ICTAI
1997
IEEE
15 years 11 months ago
1997
IEEE
Many black box optimization algorithms have sufcient exibility to allow them to adapt to the varying circumstances they encounter. These capabilities are of two primary sorts: 1) ...