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213
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AINA
2010
IEEE
16 years 19 days ago
2010
IEEE
Abstract—We describe a Bayesian formalism for the intelligent selection of observations from sensor networks that may intermittently undergo faults or changepoints. Such active d...
234
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DATE
2010
IEEE
16 years 19 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
210
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DBKDA
2010
IEEE
16 years 19 days ago
2010
IEEE
Abstract—XML indexing and search has become an important topic, and twig joins are key building blocks in XML search systems. This paper describes a novel approach using a nested...
212
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ECCV
2010
Springer
16 years 18 days ago
2010
Springer
Abstract. In this paper we propose a probabilistic framework that models shape variations and infers dense and detailed 3D shapes from a single silhouette. We model two types of sh...
191
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ECCV
2010
Springer
16 years 17 days ago
2010
Springer
Abstract. In this work the weighted minimal surface model traditionally used in multiview stereo is revisited. We propose to generalize the classical photoconsistency-weighted mini...