5570 search results - page 256 / 1114 » Applications of Fair Testing |
187
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ICCAD
1996
IEEE
15 years 11 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
181
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RTS
2008
15 years 6 months ago
2008
Abstract The multiprocessor scheduling of collections of real-time jobs is considered. Sufficient tests are derived for feasibility analysis of a collection of sporadic jobs where ...
225
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MA
2011
Springer
15 years 2 months ago
2011
Springer
The asymptotic properties of the quasi-maximum likelihood estimator (QMLE) of vector autoregressive moving-average (VARMA) models are derived under the assumption that the errors ...
175
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ICCAD
2002
IEEE
16 years 4 days ago
2002
IEEE
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
162
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ASPDAC
2000
ACM
15 years 10 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...