1113 search results - page 161 / 223 » Automated Approaches for Classifying Structures |
160
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
151
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Existing Full-wave Model Order Reduction (FMOR) approaches are based on Expanded Taylor Series Approximations (ETAS) of the oscillatory full-wave system matrix. The accuracy of su...
169
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ICSE
2009
IEEE-ACM
16 years 1 months ago
2009
IEEE-ACM
Regression test generation aims at generating a test suite that can detect behavioral differences between the original and the modified versions of a program. Regression test gen...
169
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SEFM
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract. We introduce a visual notation for local specification of concurrent components based on message sequence charts (MSCs). Each component is a finite-state machine whose ...
192
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ICAS
2008
IEEE
16 years 1 months ago
2008
IEEE
This paper addresses the need for designing user interfaces (UIs) to workflow information systems by adopting a model-centric approach. We introduce a conceptual workflow model to...