42 search results - page 8 / 9 » Automatic Test Pattern Generation for Resistive Bridging Fau... |
166
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DDECS
2009
IEEE
16 years 1 months ago
2009
IEEE
—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been shown to be a beneficial complement to traditional ATPG techniques. Boolean solvers wor...
163
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Ethernet communication devices, such as adapter, hub, bridge and switch, all follow IEEE 802.3 standard protocol. We have designed and implemented an integrated 10/100 Mbps Etherne...
184
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TCAD
2011
15 years 1 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
178
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ICCAD
2002
IEEE
16 years 3 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
158
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ITC
1999
IEEE
15 years 10 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...