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EVOW
2001
Springer
16 years 6 days ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
251
Voted
ATS
1998
IEEE
170views Hardware» more  ATS 1998»
15 years 12 months ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
DIAL
2004
IEEE
164views Image Analysis» more  DIAL 2004»
15 years 11 months ago
A Dynamic Feature Generation System for Automated Metadata Extraction in Preservation of Digital Materials
Obsolescence in storage media and the hardware and software for access and use can render old electronic files inaccessible and unusable. Therefore, the long-term preservation of ...
Song Mao, Jongwoo Kim, George R. Thoma
219
Voted
DOCENG
2005
ACM
15 years 9 months ago
Generative semantic clustering in spatial hypertext
This paper presents an iterative method for generative semantic clustering of related information elements in spatial hypertext documents. The goal is to automatically organize th...
Andruid Kerne, Eunyee Koh, Vikram Sundaram, J. Mic...
232
Voted
ML
2002
ACM
123views Machine Learning» more  ML 2002»
15 years 7 months ago
Feature Generation Using General Constructor Functions
Most classification algorithms receive as input a set of attributes of the classified objects. In many cases, however, the supplied set of attributes is not sufficient for creatin...
Shaul Markovitch, Dan Rosenstein