The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
Obsolescence in storage media and the hardware and software for access and use can render old electronic files inaccessible and unusable. Therefore, the long-term preservation of ...
This paper presents an iterative method for generative semantic clustering of related information elements in spatial hypertext documents. The goal is to automatically organize th...
Andruid Kerne, Eunyee Koh, Vikram Sundaram, J. Mic...
Most classification algorithms receive as input a set of attributes of the classified objects. In many cases, however, the supplied set of attributes is not sufficient for creatin...