1810 search results - page 70 / 362 » BASE: Using Abstraction to Improve Fault Tolerance |
174
click to vote
DAC
2006
ACM
16 years 7 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
173
click to vote
VLSID
2001
IEEE
16 years 7 months ago
2001
IEEE
A technique for signature based diagnosis using windows of different sizes is presented. It allows to obtain increased diagnostic information from a given test at a lower cost, wi...
181
Voted
TDSC
2010
15 years 5 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
189
click to vote
HIPC
2004
Springer
16 years 4 days ago
2004
Springer
Abstract. Lock-free shared data structures in the setting of distributed computing have received a fair amount of attention. Major motivations of lock-free data structures include ...
208
click to vote
HPCA
2006
IEEE
16 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...