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MPC
2004
Springer
155views Mathematics» more  MPC 2004»
16 years 6 days ago
Inferring Type Isomorphisms Generically
Abstract. Datatypes which differ inessentially in their names and structure are said to be isomorphic; for example, a ternary product is isomorphic to a nested pair of binary prod...
Frank Atanassow, Johan Jeuring
DATE
2003
IEEE
105views Hardware» more  DATE 2003»
16 years 4 days ago
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev...
DATE
2003
IEEE
76views Hardware» more  DATE 2003»
16 years 4 days ago
Modeling and Evaluation of Substrate Noise Induced by Interconnects
Interconnects have deserved attention as a source of crosstalk to other interconnects, but have been ignored as a source of substrate noise. In this paper, we evaluate the importa...
Ferran Martorell, Diego Mateo, Xavier Aragon&egrav...
DATE
2003
IEEE
105views Hardware» more  DATE 2003»
16 years 4 days ago
Detecting Soft Errors by a Purely Software Approach: Method, Tools and Experimental Results
In this paper is described a software technique allowing to detect soft errors occurring in processor-based digital architectures. The detection mechanism is based on a set of rul...
B. Nicolescu, Raoul Velazco
DATE
2002
IEEE
96views Hardware» more  DATE 2002»
15 years 11 months ago
Modeling Techniques and Tests for Partial Faults in Memory Devices
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
Zaid Al-Ars, A. J. van de Goor