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174
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
190
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DELTA
2006
IEEE
16 years 1 months ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
178
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DFT
2006
IEEE
16 years 1 months ago
2006
IEEE
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...
169
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DIAL
2006
IEEE
16 years 1 months ago
2006
IEEE
—We present a new method for interpolating binary images that outperforms existing techniques. Bitmapped images have a specific horizontal and vertical resolution. When we wish ...
215
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DSD
2006
IEEE
16 years 1 months ago
2006
IEEE
Wireless sensor networks (WSN) are composed of battery-driven communication entities performing multiple, usually different tasks. In order to complete a given task, all sensor no...