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ATS
2010
IEEE
229views Hardware» more  ATS 2010»
15 years 5 months ago
Variation-Aware Fault Modeling
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
Fabian Hopsch, Bernd Becker, Sybille Hellebrand, I...
EMNLP
2010
15 years 5 months ago
Resolving Event Noun Phrases to Their Verbal Mentions
Event Anaphora Resolution is an important task for cascaded event template extraction and other NLP study. Previous study only touched on event pronoun resolution. In this paper, ...
Bin Chen, Jian Su, Chew Lim Tan
ICCAD
2010
IEEE
121views Hardware» more  ICCAD 2010»
15 years 5 months ago
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob...
ICIP
2010
IEEE
15 years 5 months ago
Reduced-reference SSIM estimation
The structural similarity (SSIM) index has been shown to be a good perceptual image quality predictor. In many real-world applications such as network visual communications, howev...
Abdul Rehman, Zhou Wang
ICIP
2010
IEEE
15 years 5 months ago
Explore multiple clues for urban images matching
Many well-known existing image matching methods are based on local texture analysis, and consequently have difficulty handling low-textured 3D objects, such as those man-made buil...
Quan Wang, Suya You
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