170 search results - page 10 / 34 » Challenges in Embedded Memory Design and Test |
207
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CASES
2007
ACM
15 years 10 months ago
2007
ACM
Dynamic binary translation (DBT) has been used to achieve numerous goals (e.g., better performance) for general-purpose computers. Recently, DBT has also attracted attention for e...
173
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CODES
2008
IEEE
15 years 8 months ago
2008
IEEE
The capacity of flash-memory storage systems grows at a speed similar to many other storage systems. In order to properly manage the product cost, vendors face serious challenges ...
151
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DATE
2006
IEEE
16 years 13 days ago
2006
IEEE
— Embedded multiprocessors pose new challenges in the design and implementation of embedded software. This has led to the need for programming interfaces that expose the capabili...
154
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GLVLSI
2006
IEEE
16 years 13 days ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
205
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...