4299 search results - page 327 / 860 » Concurrent Test Generation |
228
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ICPR
2008
IEEE
16 years 8 months ago
2008
IEEE
Usually, performance of classifiers is evaluated on real-world problems that mainly belong to public repositories. However, we ignore the inherent properties of these data and how...
195
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DATE
2009
IEEE
16 years 2 months ago
2009
IEEE
Abstract—The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, ev...
207
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ICST
2009
IEEE
16 years 1 months ago
2009
IEEE
Java PathFinder (JPF) is a popular model checker for Java programs. JPF was used to generate object graphs as test inputs for object-oriented programs. Specifically, JPF was used...
195
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EVOW
2007
Springer
16 years 1 months ago
2007
Springer
Many instances of NP-hard problems can be solved efficiently if the treewidth of their corresponding graph is small. Finding the optimal tree decompositions is an NP-hard problem a...
180
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3DGIS
2006
Springer
16 years 1 months ago
2006
Springer
Abstract Three-dimensional (3D) building model is one of the most important components in a cyber city implementation and application. This study developed an effective and highly ...