Sciweavers

4299 search results - page 359 / 860
» Concurrent Test Generation
Sort
View
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 7 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
POPL
2010
ACM
16 years 2 months ago
Ypnos: declarative, parallel structured grid programming
A fully automatic, compiler-driven approach to parallelisation can result in unpredictable time and space costs for compiled code. On the other hand, a fully manual approach to pa...
Dominic A. Orchard, Max Bolingbroke, Alan Mycroft
ESOP
2009
Springer
16 years 2 months ago
A Basis for Verifying Multi-threaded Programs
Abstract. Advanced multi-threaded programs apply concurrency concepts in sophisticated ways. For instance, they use fine-grained locking to increase parallelism and change locking...
K. Rustan M. Leino, Peter Müller
ESOP
2007
Springer
16 years 1 months ago
CC-Pi: A Constraint-Based Language for Specifying Service Level Agreements
Abstract. Service Level Agreements are a key issue in Service Oriented Computing. SLA contracts specify client requirements and service guarantees, with emphasis on Quality of Serv...
Maria Grazia Buscemi, Ugo Montanari
SFM
2007
Springer
16 years 1 months ago
Tackling Large State Spaces in Performance Modelling
Stochastic performance models provide a powerful way of capturing and analysing the behaviour of complex concurrent systems. Traditionally, performance measures for these models ar...
William J. Knottenbelt, Jeremy T. Bradley