4299 search results - page 362 / 860 » Concurrent Test Generation |
218
click to vote
ASPLOS
2011
ACM
14 years 11 months ago
2011
ACM
Transactional memory (TM) is a promising synchronization mechanism for the next generation of multicore processors. Best-effort Hardware Transactional Memory (HTM) designs, such a...
220
click to vote
ET
2010
15 years 4 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
280
click to vote
PLDI
2011
ACM
14 years 10 months ago
2011
ACM
Compilers should be correct. To improve the quality of C compilers, we created Csmith, a randomized test-case generation tool, and spent three years using it to find compiler bug...
153
Voted
CDES
2006
15 years 8 months ago
2006
In this paper we define communicating distributed H systems with simple splicing rules of types (1,3), (1,4) and (2,3) and study the generative capacity. keyword: Splicing systems,...
197
Voted
ESANN
2003
15 years 8 months ago
2003
- A test bed of experiments with real and artificially generated data has been designed to compare the performance of three well-known algorithms for BSS. The main goal of these ex...