4299 search results - page 528 / 860 » Concurrent Test Generation |
203
click to vote
HICSS
2003
IEEE
16 years 24 days ago
2003
IEEE
The discovery of sequential patterns, which extends beyond frequent item-set finding of association rule mining, has become a challenging task due to its complexity. Essentially, ...
246
click to vote
BIRTHDAY
2003
Springer
16 years 23 days ago
2003
Springer
Abstract: In the automotive and aerospace industry, millions of technical documents are generated during the development of complex engineering products. Particularly, the universa...
201
click to vote
DATE
2010
IEEE
16 years 19 days ago
2010
IEEE
—Multi-Processor System-on-Chips (MPSoCs) exploit task-level parallelism to achieve high computation throughput, but concurrent memory accesses from multiple PEs may cause memory...
206
click to vote
CLOUD
2010
ACM
16 years 18 days ago
2010
ACM
Cloud computing has emerged as a preferred platform for deploying scalable web-applications. With the growing scale of these applications and the data associated with them, scalab...
189
click to vote
PLDI
2010
ACM
16 years 18 days ago
2010
ACM
Dynamic correctness checking tools (a.k.a. lifeguards) can detect a wide array of correctness issues, such as memory, security, and concurrency misbehavior, in unmodified executa...