15421 search results - page 2701 / 3085 » Dependability |
217
Voted
MIAR
2006
IEEE
16 years 1 months ago
2006
IEEE
Abstract. A main focus of statistical shape analysis is the description of variability of a population of geometric objects. In this paper, we present work in progress towards mode...
211
Voted
MICRO
2006
IEEE
16 years 1 months ago
2006
IEEE
One of the major issues faced by the semiconductor industry today is that of reducing chip yields. As the process technologies have scaled to smaller feature sizes, chip yields ha...
216
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MICRO
2006
IEEE
16 years 1 months ago
2006
IEEE
The advent of deep sub-micron technology has recently highlighted the criticality of the on-chip interconnects. As diminishing feature sizes have led to increases in global wiring...
242
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RTSS
2006
IEEE
16 years 1 months ago
2006
IEEE
Location services are essential to many applications running on a hybrid of wirelessly-networked mobile actors and static sensors, such as surveillance systems and the Pursuer and...
181
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SCAM
2006
IEEE
16 years 1 months ago
2006
IEEE
Traditional program slicing requires two parameters: a program location and a variable, or perhaps a set of variables, of interest. Stop-list slicing adds a third parameter to the...