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ICCAD
2008
IEEE
147views Hardware» more  ICCAD 2008»
16 years 4 months ago
Overlay aware interconnect and timing variation modeling for double patterning technology
— As Double Patterning Technology (DPT) becomes the only solution for 32-nm lithography process, we need to investigate how DPT affects the performance of a chip. In this paper, ...
Jae-Seok Yang, David Z. Pan
ICCAD
2005
IEEE
128views Hardware» more  ICCAD 2005»
16 years 4 months ago
Reducing structural bias in technology mapping
Technology mapping based on DAG-covering suffers from the problem of structural bias: the structure of the mapped netlist depends strongly on the subject graph. In this paper we ...
Satrajit Chatterjee, Alan Mishchenko, Robert K. Br...
TLDI
2009
ACM
122views Formal Methods» more  TLDI 2009»
16 years 4 months ago
Towards type-theoretic semantics for transactional concurrency
We propose a dependent type theory that integrates programming, specifications, and reasoning about higher-order concurrent programs with shared transactional memory. The design ...
Aleksandar Nanevski, Paul Govereau, Greg Morrisett
PADL
2010
Springer
16 years 4 months ago
An ER-Based Framework for Declarative Web Programming
This paper describes a framework to support the implementation of web-based systems to manipulate data stored in relational databases. Since the conceptual model of a relational da...
Michael Hanus, Sven Koschnicke
CSCW
2010
ACM
16 years 4 months ago
Sources of errors in distributed development projects: implications for collaborative tools
An important dimension of success in development projects is the quality of the new product. Researchers have primarily concentrated on developing and evaluating processes to redu...
Marcelo Cataldo