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203
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ISQED
2008
IEEE
16 years 1 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
187
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DAC
1994
ACM
15 years 11 months ago
1994
ACM
A stochastic global optimization approach is presented for transistor sizing in CMOS VLSI circuits. This is a direct search strategy for the best design among feasible ones, with ...
167
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ITCC
2005
IEEE
16 years 20 days ago
2005
IEEE
: In this paper, we propose a methodology based on genetic programming to automatically generate hardware designs of substitution boxes necessary for many cryptosystems such as DES...