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ICCAD
2007
IEEE
137views Hardware» more  ICCAD 2007»
16 years 4 months ago
Combining static and dynamic defect-tolerance techniques for nanoscale memory systems
Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan ...
170
Voted
ICCAD
2006
IEEE
93views Hardware» more  ICCAD 2006»
16 years 4 months ago
Precise identification of the worst-case voltage drop conditions in power grid verification
– Identifying worst-case voltage drop conditions in every module supplied by the power grid is a crucial problem in modern IC design. In this paper we develop a novel methodology...
Nestoras E. Evmorfopoulos, Dimitris P. Karampatzak...
ICCAD
2002
IEEE
113views Hardware» more  ICCAD 2002»
16 years 4 months ago
Interconnect-aware high-level synthesis for low power
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
Lin Zhong, Niraj K. Jha
TLDI
2010
ACM
218views Formal Methods» more  TLDI 2010»
16 years 4 months ago
Pointwise generalized algebraic data types
In the GADT (Generalized Algebraic Data Types) type system, a pattern-matching branch can draw type information from both the scrutinee type and the data constructor type. Even th...
Chuan-kai Lin, Tim Sheard
193
Voted
PEPM
2010
ACM
16 years 4 months ago
Clone detection and elimination for Haskell
Duplicated code is a well known problem in software maintenance and refactoring. Code clones tend to increase program size and several studies have shown that duplicated code make...
Christopher Brown, Simon Thompson
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