Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan ...
– Identifying worst-case voltage drop conditions in every module supplied by the power grid is a crucial problem in modern IC design. In this paper we develop a novel methodology...
Nestoras E. Evmorfopoulos, Dimitris P. Karampatzak...
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
In the GADT (Generalized Algebraic Data Types) type system, a pattern-matching branch can draw type information from both the scrutinee type and the data constructor type. Even th...
Duplicated code is a well known problem in software maintenance and refactoring. Code clones tend to increase program size and several studies have shown that duplicated code make...