2546 search results - page 116 / 510 » Designing the Future |
118
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Yield and variability are becoming detractors for successful design in sub-90-nm process technologies. We consider the fundamental lithography and process issues that are driving ...
181
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IEEECIT
2010
IEEE
15 years 5 months ago
2010
IEEE
—The great appliance of engineering makes it different from other common subjects in teaching methods. This paper puts forward a concept of case learning that is constructed with...
171
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— We propose a low-leakage register file cell design based on the observation that the physical registers in a superscalar processor have very short life cycles. When a register...
151
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CAD
2002
Springer
15 years 6 months ago
2002
Springer
This paper discusses product variety design under optimization viewpoint. Product variety design means the challenge to simultaneously design multiple products toward higher optim...
171
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SEUS
2010
IEEE
15 years 4 months ago
2010
IEEE
Abstract. Ubiquitous embedded computing systems expected to reliably perform one or more relevant tasks need design and verification methods currently not available. New envisioned...