5171 search results - page 445 / 1035 » Deterministic Parallel Processing |
184
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ICRA
2003
IEEE
16 years 26 days ago
2003
IEEE
— Mapping an environment with an imaging sensor becomes very challenging if the environment to be mapped is unknown and has to be explored. Exploration involves the planning of v...
224
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INFOCOM
2003
IEEE
16 years 26 days ago
2003
IEEE
— Recent investigations into the pricing of multiclass loss networks have shown that static prices are optimal in the asymptotic regime of many small sources. These results sugge...
159
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ITC
2003
IEEE
16 years 25 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
171
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DATE
2002
IEEE
16 years 16 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
191
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DSN
2002
IEEE
16 years 16 days ago
2002
IEEE
A virtual duplex system (VDS) can be used to increase safety without the use of structural redundancy on a single machine. If a deterministic program P is calculating a given func...