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ISSRE
2008
IEEE
16 years 28 days ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos
141
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EUROMICRO
2005
IEEE
16 years 5 days ago
Improvement of Design Specifications with Inspection and Testing
Dietmar Winkler, Bernhard Riedl, Stefan Biffl
FATES
2005
Springer
16 years 2 days ago
Play to Test
Andreas Blass, Yuri Gurevich, Lev Nachmanson, Marg...