4167 search results - page 578 / 834 » Evolutionary functional testing |
185
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COMPIMAGE
2010
Springer
16 years 9 days ago
2010
Springer
We study how the quality of an image reconstructed by a binary tomographic algorithm depends on the direction of the observed object in the scanner, if only a few projections are a...
157
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DATE
2002
IEEE
16 years 4 days ago
2002
IEEE
Accurate gate-level static timing analysis in the presence of RC loads has become an important problem for modern deep-submicron designs. Non-capacitive loads are usually analyzed...
197
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ISSRE
2002
IEEE
16 years 3 days ago
2002
IEEE
In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a furt...
178
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ISWC
2002
IEEE
16 years 3 days ago
2002
IEEE
This paper presents the e-SUIT, a wearable computer incorporated in a traditional business suit. A key feature of the system is an array of input/output devices integrated into th...
167
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ITC
2002
IEEE
16 years 3 days ago
2002
IEEE
The continued market demand for GHz processors and high-capacity communication systems results in an increasing number of low-cost high volume ICs with multi-GHz clocks and/or mul...