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ISQED
2008
IEEE
150views Hardware» more  ISQED 2008»
16 years 1 months ago
Dominant Substrate Noise Coupling Mechanism for Multiple Switching Gates
— The dominant substrate noise coupling mechanism is determined for multiple switching gates based on a physically intuitive model. The model exhibits reasonable accuracy as comp...
Emre Salman, Eby G. Friedman, Radu M. Secareanu, O...
DFT
2007
IEEE
95views VLSI» more  DFT 2007»
16 years 1 months ago
Fault Tolerant Source Routing for Network-on-Chip
This paper presents a new routing protocol of network-on-chip(Noc) called ‘Source Routing for Noc’(SRN) for fault tolerant communication of Systems-on-chip(Soc). The proposed ...
Young Bok Kim, Yong-Bin Kim
DSD
2007
IEEE
83views Hardware» more  DSD 2007»
16 years 1 months ago
Hierarchical Identification of Untestable Faults in Sequential Circuits
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kru...
VTC
2007
IEEE
16 years 1 months ago
Fast and Area-Efficient Sphere Decoding Using Look-Ahead Search
— Sphere decoding enables maximum likelihood (ML) detection with fairly low complexity in the MIMO wireless systems, but it takes hundreds cycles at low SNR environment. This pap...
Se-Hyeon Kang, In-Cheol Park
DATE
2010
IEEE
170views Hardware» more  DATE 2010»
15 years 12 months ago
Analytical model for TDDB-based performance degradation in combinational logic
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
Mihir Choudhury, Vikas Chandra, Kartik Mohanram, R...