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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 10 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
MICAI
2000
Springer
15 years 10 months ago
Searching for a Solution to Program Verification=Equation Solving in CCS
Unique Fixpoint Induction, UFI, is a chief inference rule to prove the equivalence of recursive processes in CCS [7]. It plays a major role in the equational approach to verificati...
Raul Monroy, Alan Bundy, Ian Green
RT
2000
Springer
15 years 10 months ago
Parameterized Animation Compression
Synthetic images can be parameterized by more than time or viewpoint. We generalize image-based rendering by exploiting texture-mapping graphics hardware to decompress ray-traced ...
Ziyad S. Hakura, Jerome Edward Lengyel, John M. Sn...
174
Voted
ASPDAC
1995
ACM
103views Hardware» more  ASPDAC 1995»
15 years 10 months ago
A scheduling algorithm for multiport memory minimization in datapath synthesis
- In this paper, we present a new scheduling algorithms that generates area-efficient register transfer level datapaths with multiport memories. The proposed scheduling algorithm a...
Hae-Dong Lee, Sun-Young Hwang
ICSM
1995
IEEE
15 years 10 months ago
Discovering relationships between service and customer satisfaction
Organizations spend significant resources tracking customer satisfaction and managing service delivery. Although a great deal of effort is expended in understanding what goes on w...
Michael Buckley, Ram Chillarege
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