11321 search results - page 2168 / 2265 » Improvements to Turing's method |
223
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GLVLSI
2003
IEEE
16 years 5 days ago
2003
IEEE
One of the fundamental problems in Deep Sub Micron (DSM) circuits is Simultaneous Switching Noise (SSN), which causes voltage fluctuations in the circuit power/ground networks. In...
214
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ICCAD
2003
IEEE
16 years 5 days ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
169
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ICDAR
2003
IEEE
16 years 5 days ago
2003
IEEE
The decomposition of a document into segments such as text regions and graphics is a significant part of the document analysis process. The basic requirement for rating and impro...
179
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ICNP
2003
IEEE
16 years 5 days ago
2003
IEEE
BGP has been deployed in Internet for more than a decade. However, the events that cause BGP topological changes are not well understood. Although large traces of routing updates ...
213
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ICPP
2003
IEEE
16 years 5 days ago
2003
IEEE
Process/thread migration and checkpointing schemes support load balancing, load sharing and fault tolerance to improve application performance and system resource usage on worksta...