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196
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VTS
2008
IEEE
16 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
177
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ACSC
2007
IEEE
16 years 1 months ago
2007
IEEE
The standard layered drawing convention for trees in which the vertical placement of a node is given by its level in the tree and each node is centered between its children can le...
234
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APCSAC
2007
IEEE
16 years 1 months ago
2007
IEEE
The majority of currently available dynamic branch predictors base their prediction accuracy on the previous k branch outcomes. Such predictors sustain high prediction accuracy but...
221
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CNSR
2007
IEEE
16 years 1 months ago
2007
IEEE
In this paper, the issue of channel estimation with multiple In-Cell co-channel Users (ICUs) in the presence of Out of Cell Interferers (OCIs) is addressed. A Single Carrier Frequ...
217
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COMPSAC
2007
IEEE
16 years 1 months ago
2007
IEEE
Recently SQL Injection Attack (SIA) has become a major threat to Web applications. Via carefully crafted user input, attackers can expose or manipulate the back-end database of a ...