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ITC
2003
IEEE
113views Hardware» more  ITC 2003»
16 years 26 days ago
Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy
A two-wire test strategy with simultaneous bidirectional data flow and an independent clock line enables very high site count low-cost wafer probing.
Burnell G. West
PG
2003
IEEE
16 years 26 days ago
Illustration Watermarks for Vector Graphics
Digital watermarking is a technique for embedding information into data, such as images, 3D models, or audio files, such that some properties (i. e., security, imperceptibility, ...
Henry Sonnet, Tobias Isenberg, Jana Dittmann, Thom...
JCDL
2003
ACM
160views Education» more  JCDL 2003»
16 years 25 days ago
Automatic Document Metadata Extraction Using Support Vector Machines
Automatic metadata generation provides scalability and usability for digital libraries and their collections. Machine learning methods offer robust and adaptable automatic metadat...
Hui Han, C. Lee Giles, Eren Manavoglu, Hongyuan Zh...
SMI
1999
IEEE
15 years 12 months ago
Variational Constraints in 3D
We discuss how to solve variational constraint problems involving points, lines and planes. We concentrate on small problems that must be solved simultaneously.
Cassiano Durand, Christoph M. Hoffmann
ISCA
1998
IEEE
136views Hardware» more  ISCA 1998»
15 years 12 months ago
Exploiting Spatial Locality in Data Caches Using Spatial Footprints
Modern cache designs exploit spatial locality by fetching large blocks of data called cache lines on a cache miss. Subsequent references to words within the same cache line result...
Sanjeev Kumar, Christopher B. Wilkerson