71 search results - page 2 / 15 » Mining IC test data to optimize VLSI testing |
158
Voted
VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
211
Voted
KDD
2005
ACM
16 years 6 months ago
2005
ACM
In an interactive classification application, a user may find it more valuable to develop a diagnostic decision support method which can reveal significant classification behavior...
204
Voted
FCCM
2006
IEEE
15 years 10 months ago
2006
IEEE
The Apriori algorithm is a fundamental correlation-based data mining kernel used in a variety of fields. The innovation in this paper is a highly parallel custom architecture impl...
171
Voted
GLVLSI
2005
IEEE
15 years 12 months ago
2005
IEEE
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
180
Voted
SDM
2008
SIAM
15 years 7 months ago
2008
SIAM
In this paper we present the Dynamic Grow-Shrink Inference-based Markov network learning algorithm (abbreviated DGSIMN), which improves on GSIMN, the state-ofthe-art algorithm for...