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DATE
2002
IEEE
94views Hardware» more  DATE 2002»
16 years 6 days ago
FACTOR: A Hierarchical Methodology for Functional Test Generation and Testability Analysis
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
Vivekananda M. Vedula, Jacob A. Abraham
DSN
2002
IEEE
16 years 6 days ago
Transactional Rollback for Language-Based Systems
Language run-time systems are routinely used to host potentially buggy or malicious codelets — software modules, agents, applets, etc. — in a secure environment. A number of t...
Algis Rudys, Dan S. Wallach
HAPTICS
2002
IEEE
16 years 6 days ago
The Rutgers Master II-ND Force Feedback Glove
The Rutgers Master II-ND glove is a follow up on the earlier Rutgers Master II haptic interface. The redesigned glove has all the sensing placed on palm support, avoiding routing ...
Mourad Bouzit, George V. Popescu, Grigore C. Burde...
HASE
2002
IEEE
16 years 6 days ago
Coyote: An XML-Based Framework for Web Services Testing
Web services received significant attention recently and several important web service platforms such as .NET are now available. The testing and evaluation of web services are imp...
Wei-Tek Tsai, Raymond A. Paul, Weiwei Song, Zhibin...
HPDC
2002
IEEE
16 years 5 days ago
Design and Evaluation of a Resource Selection Framework for Grid Applications
While distributed, heterogeneous collections of computers (“Grids”) can in principle be used as a computing platform, in practice the problems of first discovering and then co...
Chuang Liu, Lingyun Yang, Ian T. Foster, Dave Angu...