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148
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DAC
2005
ACM
16 years 8 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
179
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SIGSOFT
2007
ACM
16 years 8 months ago
2007
ACM
A compiler-checked immutability guarantee provides useful documentation, facilitates reasoning, and enables optimizations. This paper presents Immutability Generic Java (IGJ), a n...
193
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SIGSOFT
2004
ACM
16 years 8 months ago
2004
ACM
Dynamic detection of likely invariants is a program analysis that generalizes over observed values to hypothesize program properties. The reported program properties are a set of ...
174
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ISBI
2004
IEEE
16 years 8 months ago
2004
IEEE
A novel ultrafast-laser-based x-ray source is a promising candidate for replacement of a microfocal X-ray tube in a micro-CT system for small-animal imaging. We optimized conditio...
208
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ISBI
2006
IEEE
16 years 8 months ago
2006
IEEE
Mutual information (MI) based image-registration methods that use histograms are known to suffer from the so-called binning problem, caused by the absence of a principled techniqu...