9739 search results - page 363 / 1948 » Object-Oriented Analysis and Design |
145
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TCAD
2008
15 years 7 months ago
2008
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
185
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TCAD
2008
15 years 7 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
269
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DSD
2010
IEEE
15 years 5 months ago
2010
IEEE
Reconfigurable FPGA based Systems-on-Chip (SoC) architectures are increasingly becoming the preferred solution for implementing modern embedded systems, due to their flexible natur...
224
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DAC
2008
ACM
2008
ACM
Model checking based analysis of end-to-end latency in embedded, real-time systems with clock drifts
16 years 8 months ago
End-to-end latency of messages is an important design parameter that needs to be within specified bounds for the correct functioning of distributed real-time control systems. In t...
216
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
In this paper, a Triangularization Based Structure preserving (TBS) model order reduction is proposed to verify power integrity of on-chip structured power grid. The power grid is...