9739 search results - page 365 / 1948 » Object-Oriented Analysis and Design |
206
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FMCAD
2008
Springer
15 years 9 months ago
2008
Springer
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...
191
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DAC
2012
ACM
13 years 10 months ago
2012
ACM
Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works model TSVs and pow...
213
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ECCV
2008
Springer
16 years 9 months ago
2008
Springer
Computer vision has traditionally focused on extracting structure, such as depth, from images acquired using thin-lens or pinhole optics. The development of computational imaging i...
191
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
197
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HPCA
2006
IEEE
16 years 8 months ago
2006
IEEE
Processor architects have a challenging task of evaluating a large design space consisting of several interacting parameters and optimizations. In order to assist architects in ma...