3641 search results - page 220 / 729 » On Computability of Pattern Recognition Problems |
174
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ICPP
2005
IEEE
16 years 23 days ago
2005
IEEE
Automatic pattern search in event traces is a powerful method to identify performance problems in parallel applications. We demonstrate that knowledge about the virtual topology, ...
207
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ISPD
2010
ACM
16 years 2 months ago
2010
ACM
Double Patterning Lithography (DPL) is one of the few hopeful candidate solutions for the lithography for CMOS process beyond 45nm. DPL assigns the patterns less than a certain di...
173
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ICPR
2002
IEEE
16 years 8 months ago
2002
IEEE
In this paper the effectiveness of a corrective learning algorithm MIL (Mirror Image Learning) [1], [2] is comparatively studied with that of GLVQ (Generalized Learning Vector Qua...
169
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ICPR
2006
IEEE
16 years 8 months ago
2006
IEEE
In this paper we present a minimum sphere covering approach to pattern classification that seeks to construct a minimum number of spheres to represent the training data and formul...
180
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WADS
2005
Springer
16 years 20 days ago
2005
Springer
We analyze the performance of simple algorithms for matching two planar point sets under rigid transformations so as to minimize the directed Hausdorff distance between the sets....