1187 search results - page 48 / 238 » On Modeling Cross-Talk Faults |
171
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FTRTFT
2000
Springer
15 years 10 months ago
2000
Springer
Formal methods can improve the development of systems with high quality requirements, since they usually o er a precise, nonambiguous speci cation language and allow rigorous veri ...
138
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ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
164
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MTDT
2000
IEEE
15 years 11 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
150
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ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
155
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ETS
2010
IEEE
15 years 7 months ago
2010
IEEE
This paper explores the concept of design diversity redundancy applied to mixed-signal (MS) circuit blocks, as a proposal to increase system reliability. Three different implement...