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» On the Complexity of Numerical Analysis
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EOR
2007
85views more  EOR 2007»
15 years 7 months ago
Modeling and analysis of a supply-assembly-store chain
We consider a supply–assembly–store chain with produce-to-stock strategy, which comprises a set of component suppliers, a mixed-model assembly line with a constantly moving co...
Xiaobo Zhao, Deju Xu, Hanqin Zhang, Qi-Ming He
SIGMETRICS
2008
ACM
161views Hardware» more  SIGMETRICS 2008»
15 years 7 months ago
Bound analysis of closed queueing networks with workload burstiness
Burstiness and temporal dependence in service processes are often found in multi-tier architectures and storage devices and must be captured accurately in capacity planning models...
Giuliano Casale, Ningfang Mi, Evgenia Smirni
LRE
2007
101views more  LRE 2007»
15 years 7 months ago
The CHIL audiovisual corpus for lecture and meeting analysis inside smart rooms
The analysis of lectures and meetings inside smart rooms has recently attracted much interest in the literature, being the focus of international projects and technology evaluation...
Djamel Mostefa, Nicolas Moreau, Khalid Choukri, Ge...
JAT
2010
109views more  JAT 2010»
15 years 6 months ago
Networks of polynomial pieces with application to the analysis of point clouds and images
We consider H¨older smoothness classes of surfaces for which we construct piecewise polynomial approximation networks, which are graphs with polynomial pieces as nodes and edges ...
Ery Arias-Castro, Boris Efros, Ofer Levi
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
16 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu