7272 search results - page 1142 / 1455 » On the Performance of Selection Relaying |
178
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ITC
2003
IEEE
16 years 25 days ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
164
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KBSE
2003
IEEE
16 years 25 days ago
2003
IEEE
Automating software evolution requires both identifying precisely the affected program points and selecting the appropriate modification at each point. This task is particularly ...
184
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KBSE
2003
IEEE
16 years 25 days ago
2003
IEEE
We present a method for performing fault localization using similar program spectra. Our method assumes the existence of a faulty run and a larger number of correct runs. It then ...
188
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LAWEB
2003
IEEE
16 years 25 days ago
2003
IEEE
Web crawler design presents many different challenges: architecture, strategies, performance and more. One of the most important research topics concerns improving the selection o...
213
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RSP
2003
IEEE
16 years 25 days ago
2003
IEEE
With advances in semiconductor technology, processors are becoming larger and more complex. Future processor designers will face an enormous design space, and must evaluate more a...