8810 search results - page 223 / 1762 » Openness |
160
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ATS
2002
IEEE
16 years 3 days ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
121
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HICSS
2002
IEEE
16 years 3 days ago
2002
IEEE
158
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ICPPW
2002
IEEE
16 years 3 days ago
2002
IEEE
OAI is designed with a low-barrier technology approach, thus allowing institutions to provide content metadata with little effort. On the other hand, search capabilities are very ...