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ITC
2002
IEEE
114views Hardware» more  ITC 2002»
16 years 9 days ago
Scan Power Reduction Through Test Data Transition Frequency Analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
FORTE
2000
15 years 8 months ago
On Test Derivation from Partial Specifications
The paper addresses the problem of test derivation from partially defined specifications. A specification is modeled by an Input/Output FSM such that transitions from some states ...
Alexandre Petrenko, Nina Yevtushenko
ISICA
2007
Springer
16 years 1 months ago
Interplanetary Trajectory Optimization with Swing-Bys Using Evolutionary Multi-objective Optimization
Abstract. Interplanetary trajectory optimization studies mostly considered a single objective of minimizing travel time between two planets or launch velocity of spacecraft at the ...
Kalyanmoy Deb, Nikhil Padhye, Ganesh Neema
DAC
2008
ACM
16 years 8 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
VTS
2008
IEEE
104views Hardware» more  VTS 2008»
16 years 1 months ago
Signature Rollback - A Technique for Testing Robust Circuits
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
Uranmandakh Amgalan, Christian Hachmann, Sybille H...