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LCTRTS
2009
Springer
16 years 2 months ago
Addressing the challenges of DBT for the ARM architecture
Dynamic binary translation (DBT) can provide security, virtualization, resource management and other desirable services to embedded systems. Although DBT has many benefits, its r...
Ryan W. Moore, José Baiocchi, Bruce R. Chil...
201
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GLVLSI
2009
IEEE
103views VLSI» more  GLVLSI 2009»
16 years 2 months ago
Enhancing bug hunting using high-level symbolic simulation
The miniaturization of transistors in recent technology nodes requires tremendous back-end tuning and optimizations, making bug fixing at later design stages more expensive. Ther...
Hong-Zu Chou, I-Hui Lin, Ching-Sung Yang, Kai-Hui ...
225
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SMA
2009
ACM
149views Solid Modeling» more  SMA 2009»
16 years 2 months ago
A sketching interface for feature curve recovery of free-form surfaces
In this paper, we present a semi-automatic approach to efficiently and robustly recover the characteristic feature curves of a given free-form surface. The technique supports a s...
Ellen Dekkers, Leif Kobbelt, Richard R. Pawlicki, ...
203
Voted
FGR
2008
IEEE
153views Biometrics» more  FGR 2008»
16 years 2 months ago
Facial image analysis using local feature adaptation prior to learning
Many facial image analysis methods rely on learningbased techniques such as Adaboost or SVMs to project classifiers based on the selection of local image filters (e.g., Haar and...
Rogerio Feris, Ying-li Tian, Yun Zhai, Arun Hampap...
177
Voted
DATE
2007
IEEE
86views Hardware» more  DATE 2007»
16 years 2 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
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