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DATE
2006
IEEE
111views Hardware» more  DATE 2006»
16 years 1 months ago
Extraction of defect density and size distributions from wafer sort test results
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
WOSS
2004
ACM
16 years 15 days ago
A control-based framework for self-managing distributed computing systems
This paper describes an online control framework to design self-managing distributed computing systems that continually optimize their performance in response to changing computin...
Sherif Abdelwahed, Nagarajan Kandasamy, Sandeep Ne...
ADMA
2005
Springer
117views Data Mining» more  ADMA 2005»
15 years 9 months ago
Context-Sensitive Regression Analysis for Distributed Data
A precondition of existing ensemble-based distributed data mining techniques is the assumption that contributing data are identically and independently distributed. However, this a...
Yan Xing, Michael G. Madden, Jim Duggan, Gerard Ly...
CASCON
1997
135views Education» more  CASCON 1997»
15 years 8 months ago
Automatic generation of performance models using the distributed management framework (DMF)
The purpose of the Distributed Management Framework (DMF) is to provide a layer of ion at a level convenient for management application developers. Specifically, it liberates the ...
Asham El Rayess, Jerome A. Rolia
TCSV
2008
129views more  TCSV 2008»
15 years 7 months ago
Efficient Architecture Design of Motion-Compensated Temporal Filtering/Motion Compensated Prediction Engine
Since motion-compensated temporal filtering (MCTF) becomes an important temporal prediction scheme in video coding algorithms, this paper presents an efficient temporal prediction ...
Yi-Hau Chen, Chih-Chi Cheng, Tzu-Der Chuang, Ching...