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ASPDAC
2010
ACM
637views Hardware» more  ASPDAC 2010»
15 years 5 months ago
A new graph-theoretic, multi-objective layout decomposition framework for double patterning lithography
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
Jae-Seok Yang, Katrina Lu, Minsik Cho, Kun Yuan, D...
FPL
2010
Springer
108views Hardware» more  FPL 2010»
15 years 5 months ago
FPGA Based Network Traffic Analysis Using Traffic Dispersion Patterns
The problem of Network Traffic Classification (NTC) has attracted significant amount of interest in the research community, offering a wide range of solutions at various levels. Th...
Faisal Khan, Maya Gokhale, Chen-Nee Chuah
ERLANG
2007
ACM
15 years 11 months ago
Extended process registry for Erlang
The built-in process registry has proven to be an extremely useful feature of the Erlang language. It makes it easy to provide named services, which can be reached without knowing...
Ulf Wiger
AMT
2006
Springer
107views Multimedia» more  AMT 2006»
15 years 11 months ago
An Intelligent Process Monitoring System in Complex Manufacturing Environment
In high-tech industries, most manufacturing processes are complexly intertwined, in that manufacturers or engineers can hardly control a whole set of processes. They are only capa...
Sung Ho Ha, Boo-Sik Kang
PROFES
2007
Springer
16 years 1 months ago
Improving an Industrial Reference Process by Information Flow Analysis: A Case Study
Reference processes are supposed to be the basis for collaboration and mature cooperation in software development. Large business organizations need large and diverse reference pro...
Kai Stapel, Kurt Schneider, Daniel Lübke, Tho...